Details

An introduction to unit testing design patterns illustrated by an in depth look at Test Doubles (Dummies, Mocks, Fakes And Stubs). Unit testing is a widely used agile technique. The basics can be learnt quickly but developers new to unit testing often struggle to create high quality, maintainable tests. Design patterns describe a solution  vocabulary for reoccurring concepts. They are widely used as tools to improve the quality of object oriented designs. This talk introduces the pattern language of the unit testing domain, illustrated by Test Doubles: Dummies, Mocks, Fakes and Stubs (an area with many traps for the unwary).

Speaker

Robert Burrell Donkin is an active Open Source contributor best known for work in Jakarta (now Apache) Commons and was elected a Member of the Apache Software Foundation in 2005. During the day, he designs and develops enterprise systems in Java using a mixture of agile techniques.