Details
An introduction to unit testing design patterns illustrated by an in
depth look at Test Doubles (Dummies, Mocks, Fakes And Stubs).
Unit testing is a widely used agile technique. The basics can be
learnt quickly but developers new to unit testing often struggle to
create high quality, maintainable tests. Design patterns describe a
solution
vocabulary for reoccurring concepts. They are widely used as tools to
improve
the quality of object oriented designs. This talk introduces the
pattern language of the unit testing domain, illustrated by Test
Doubles: Dummies, Mocks, Fakes and Stubs (an area with many traps for
the
unwary).
Speaker
Robert Burrell Donkin is an active Open Source contributor best
known for work in Jakarta (now Apache) Commons and was elected a Member of
the Apache Software Foundation in 2005. During the day, he designs and
develops enterprise systems in Java using a mixture of agile
techniques.
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